TABLE OF CONTENT
01     LIV FUNCTIONALITY TEST SYSTEM
02     FUNCTIONALITY TESTING
03     AREAS OF APPLICATION
04     HARDWARE FEATURES
05     SOFTWARE FEATURES
06     OPTIONS
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01     GALLERY
02     FLYER
 
 
FUNCTIONALITY TESTING
 
Functionality testing and IV characterization are essential for understanding and optimizing performance of organic electronics devices.

Typically devices under test such as OLEDs, OPVs, or organic sensors show diode like current voltage (IV) characteristics. Especially for OLEDs only very small currents are detected under reverse bias conditions. To allow interpretation of these leakage currents and to draw conclusions on device performance or potential defects, current measurement accuracy in the nA range is required. In forward bias direction currents are orders of magnitude higher. Consequently, a large dynamic current measurement range as well as a wide voltage range is necessary for comprehensive functionality testing and IV characterization.

For light emitting devices, such as OLEDs, the dependence of light emission on bias voltage or driving current (LIV, IVL or UIL characteristics) is measured with optical detectors. As for the electrical parameters a large dynamic range is also required for the optical measurements. The LIV Functionality Test System offers several options for sensors fulfilling the requirements for light emission measurements. The standard configuration includes a V(λ) corrected photodiode, allowing comparable measurements in different spectral ranges.


To achieve optimum system performance and synchronous high speed operation of all electrical and optical parameters, the operation software has to be well adapted to the specific test hardware. Furthermore, to ensure that electrical parameters are not distorted, special sample holders adapted to the specific device layouts are required.

By combining specially designed source measure units, customized sample holders, and dedicated software the LIV provides a complete solution for organic electronics testing. It ensures that the capabilities of the test system are best utilized and that it is ideally adapted to specific testing needs.