TABLE OF CONTENT
01 OLT LIFETIME TEST SYSTEM
02 OLED LIFETIME
03 CAPABILITY
04 BENEFITS
05 SYSTEM CONCEPT
06 OPTIONS
07 AREAS OF APPLICATION
08 SYSTEM CONFIGURATION
MORE
01 GALLERY
02 FLYER
03 PUBLICATIONS
BENEFITS
TESTING
Independent driving and measuring of each channel
Various driving modes for each channel: Constant current / voltage, Pulsed current / voltage, Mixed pulse mode
Customized grouping of test channels for customer specific device layout
Integrated IVL mode for electrooptical characterization during lifetime testing
MEASURING
Color Monitoring with RGB TrueColor Sensors
Factory calibration for calculation of CIE color coordinates and of device luminance from measured signals
Adjustable gain for optimum measurement conditions in a wide luminance range
Temperature measurement at sensor level for compensation of sensor temperature dependence
On-sample temperature measurement for monitoring device temperature during testing
SOFTWARE
Customized graphical user interface for customer specific device layout
Customized output data format for compatibility with customer data analysis tools
Software module for fitting and extrapolating lifetime data
Operator mode for standard testing with predefined test recipes
Smart data recording with event driven triggers
Customer defined “Start of lifetime” and “End of lifetime” test criteria
SYSTEM
Highly modular concept to allow for easy system expansion and modification
Customized sample holders to fit customer specific device layouts
Integrated heating elements for accelerated lifetime testing at high temperatures
Sample holders suited for climate chamber use
Interface for fiber optical spectrometer
