| OPTIONS |
| Many components and features of the OLT Lifetime Test System can be adapted to specific customer requirements. The sensor board and the sample holder with fixture and contacting pattern can be customized for different device sizes and layouts. Various additional options are available to enhance system features and benefits even more. |
  TEMPERATURE CONTROLSample heating integrated in the sample holder is available as an option. This allows accelerated lifetime testing at elevated temperature without requiring a temperature chamber. Any perturbation of running tests by changing samples or opening the temperature chamber door is excluded. With the integrated heating tests can be performed in a temperature range of 40°C to 90°C with 1°C accuracy. As an alternative to the sample heating, temperature control with Peltier elements is also available. This option is integrated in the sample holder, too, and allows running tests in a temperature range of 0°C to 90°C. For both configurations temperature ramps are possible. Each element is controlled individually. This allows for test setups with different sample temperatures, giving greater flexibility for determination of the temperature dependence of performance parameters. The temperature control unit can be accessed via software to set and record temperature data. |
  SPECTROMETER INTERFACEAn interface for connecting a fiber optical spectrometer to the OLT sample holder is available as an option. This allows for recording emission spectra of the devices under test at any time during lifetime testing. All tests can be continued. No interruption, e.g. by unmounting of the sample is necessary. Timers for repeated spectra recording are available and allow for automated measurements and monitoring of changes in emission characteristics. Depending on spectrometer configuration calculation of CIE color coordinates and absolute luminance from the recorded spectra is possible. |
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