TABLE OF CONTENT
01     PCT PHOTOELECTRIC TEST SYSTEM
02     DEFECT ANALYSIS IN ORGANIC SEMICONDUCTOR DEVICES
03     PCT PRINCIPLE OF OPERATION
04     PCT MEASUREMENT MODES
05     TEST EXAMPLES
06     AREAS OF APPLICATION
07     BENEFITS
08     SYSTEM OVERVIEW AND CONFIGURATION
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01     GALLERY
02     FLYER
03     PUBLICATIONS
 
 
AREAS OF APPLICATION
 
THE PCT IS SUITED FOR USE IN MATERIAL RESEARCH AND DEVICE DEVELOPMENT AS WELL AS IN PRODUCTION AND QUALITY CONTROL. EXAMPLES OF AREAS OF APPLICATION ARE:

  • Spatially resolved performance analysis of devices
  • Investigation of device defects
  • Investigation of coating defects in production, research and development
  • Investigation of device degradation
  • Testing of different encapsulations
  • Testing of electrical contacts
  • Testing of devices in operation (e.g. OLED Panels, PM/AM Displays and OPV Panels)
  • Process control
  • In-Line inspection of intermediate products
  • Quality control of end products