| BENEFITS |
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COMPARED TO OTHER TEST METHODS THE PCT ALLOWS FOR:
- Illustration of defects in different applications of organic semiconductors
- The photoelectrical properties of the semiconducting materials are extremely sensitive to variations
- Non-uniformities not even visible in emission can be observed
- Spatially resolved imaging for non-emitting applications of organic semiconductors
- Visualization of local performance (degradation) in organic semiconductors
- First step in the analysis of defects in organic semiconductors
- Current mapping shows effects in active materials
- Voltage mapping & local IV characteristics show effects of contacts / interfaces
- Prediction of degradation processes in OLEDs
- Photoelectric properties might allow early conclusions on future device behavior
- Device defects are detected earlier than with other methods
- Conclusions on the causes for device failure might be possible
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