TABLE OF CONTENT
01     PCT PHOTOELECTRIC TEST SYSTEM
02     DEFECT ANALYSIS IN ORGANIC SEMICONDUCTOR DEVICES
03     PCT PRINCIPLE OF OPERATION
04     PCT MEASUREMENT MODES
05     TEST EXAMPLES
06     AREAS OF APPLICATION
07     BENEFITS
08     SYSTEM OVERVIEW AND CONFIGURATION
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01     GALLERY
02     FLYER
03     PUBLICATIONS
 
 
SYSTEM OVERVIEW & CONFIGURATION
 
IN THE STANDARD CONFIGURATION THE PCT IS EQUIPPED WITH THE FOLLOWING COMPONENTS:

  • Beam unit with diode laser system. Laser wavelength and power depending on customer requirements, e.g. 405nm, 25mW, 445 nm, 40 mW, etc.
  • Focus and deflection unit (spot size <40µm, step width min. 2,5 µm)
  • Measurement unit with high measurement speed and high resolution (< 1ms per test point, depending on material, 1nA resolution for photocurrent measurement)
  • Sample holder
  • Camera for working area
  • User friendly software with different test and analysis functions
  • PC and monitor

IN ADDITION TO THE STANDARD CONFIGURATION THE FOLLOWING OPTIONAL COMPONENTS ARE AVAILABLE:

  • 2nd beam unit with double-X/Y-deflection unit
  • Electrical beam size adjustment
  • Beam profiler with PC-connection
  • Extension of the measurement range
  • Inspection camera with manual adjustment